Organisation
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Aktivitäten
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Angebote für Studenten |
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Bereiche im Nanotechnikum |
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Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4, D-06120 Halle, Germany
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| H. S. Leipner, M. Kittler Preface phys. stat. sol. (c) 4, 8 (2007), VIII |
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| H. S. Leipner (Ed.) Proceedings of the International conference on Extended defects in semiconductors (EDS 2006) Weinheim: Wiley-VCH (2007), |
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| L. Schubert Herstellung und Charakterisierung von Silizium Nanodrähten mittels Molekularstrahlepitaxie Dissertation (2007), |
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| M. Schade, F. Heyroth, F. Syrowatka, H. S. Leipner, T. Boeck, M. Hanke Investigation of the chemical composition profile of SiGe/Si(001) islands by analytical transmission electron microscopy Appl. Phys. Lett. 90 (2007), 263101 |
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| Vladimir Sivakov, Frank Heyroth, Fritz Falk, Gudrun Andrä, Silke Christiansen Silicon nanowire growth by electron beam evaporation: kinetic and energetic contributions to the growth morphology. J. Cryst. Growth 300, 2 (2007), 288-293 |
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| J. Bauer, V. Gottschalch, H. Paetzelt, G. Wagner, B. Fuhrmann, H. S. Leipner MOVPE growth and real structure of vertical-aligned GaAs nanowires J. Cryst. Growth 298 (2007), 625-630 |
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| J. Bauer, F. Fleischer, O. Breitenstein, L. Schubert, P. Werner, U. Gösele, M. Zacharias Electrical properties of nominally undoped silicon nanowires grown by molecular-beam epitaxy Appl. Phys. Lett. 90 (2007), 012105 |
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| M. Hanke, C. Eisenschmidt, P. Werner, N. D. Zakharov, R. Syrowatka, F. Heyroth, P. Schäfer, O. Konovalov Elastic strain relaxation in axial Si/Ge whisker heterostructures Phys. Rev. B 75 (2007), 161303R |
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M. Schade, F. Heyroth, H. S. Leipner, M. Hanke Combined HRXRD and EELS investigations of SiGe/Si(001) islands grown by means of liquid phase epitaxy. Microsc. Microanal. 13 (2007), Suppl. 3 |
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| S. Thraenert, E. M. Hassan, D. Enke, D. Fuerst, R. Krause-Rehberg Verifying the RTE model: ortho-positronium lifetime measurement on controlled pore glasses. phys. stat. sol. (c) 4, 10 (2007), 3819-3822 |
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