Interdisziplinäres Zentrum für Materialwissenschaften
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Martin-Luther-Universität
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany
Tel.: +49 345 55 28471
Telefax:+49 345 55 27390 email: info@cmat.uni-halle.de
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abstractH. S. Leipner, M. Kittler
Preface
phys. stat. sol. (c) 4, 8 (2007), VIII
 
abstractH. S. Leipner (Ed.)
Proceedings of the International conference on Extended defects in semiconductors (EDS 2006)
Weinheim: Wiley-VCH (2007),
 
abstractL. Schubert
Herstellung und Charakterisierung von Silizium Nanodrähten mittels Molekularstrahlepitaxie
Dissertation (2007),
 
abstractM. Schade, F. Heyroth, F. Syrowatka, H. S. Leipner, T. Boeck, M. Hanke
Investigation of the chemical composition profile of SiGe/Si(001) islands by analytical transmission electron microscopy
Appl. Phys. Lett. 90 (2007), 263101
 
abstractVladimir Sivakov, Frank Heyroth, Fritz Falk, Gudrun Andrä, Silke Christiansen
Silicon nanowire growth by electron beam evaporation: kinetic and energetic contributions to the growth morphology.
J. Cryst. Growth 300, 2 (2007), 288-293
 
abstractJ. Bauer, V. Gottschalch, H. Paetzelt, G. Wagner, B. Fuhrmann, H. S. Leipner
MOVPE growth and real structure of vertical-aligned GaAs nanowires
J. Cryst. Growth 298 (2007), 625-630
 
abstractJ. Bauer, F. Fleischer, O. Breitenstein, L. Schubert, P. Werner, U. Gösele, M. Zacharias
Electrical properties of nominally undoped silicon nanowires grown by molecular-beam epitaxy
Appl. Phys. Lett. 90 (2007), 012105
 
abstractM. Hanke, C. Eisenschmidt, P. Werner, N. D. Zakharov, R. Syrowatka, F. Heyroth, P. Schäfer, O. Konovalov
Elastic strain relaxation in axial Si/Ge whisker heterostructures
Phys. Rev. B 75 (2007), 161303R
 
unfortunately no abstract available M. Schade, F. Heyroth, H. S. Leipner, M. Hanke
Combined HRXRD and EELS investigations of SiGe/Si(001) islands grown by means of liquid phase epitaxy.
Microsc. Microanal. 13 (2007), Suppl. 3
 
abstractS. Thraenert, E. M. Hassan, D. Enke, D. Fuerst, R. Krause-Rehberg
Verifying the RTE model: ortho-positronium lifetime measurement on controlled pore glasses.
phys. stat. sol. (c) 4, 10 (2007), 3819-3822
 
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