Interdisziplinäres Zentrum für Materialwissenschaften
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Martin-Luther-University
Interdisziplinäres Zentrum für Materialwissenschaften
Nanotechnikum Weinberg
Heinrich-Damerow-Str. 4,
D-06120 Halle, Germany
Phone: +49 345 55 28471
Telefax:+49 345 55 27390 e-mail: info@cmat.uni-halle.de
[Papers] [Theses] [Reports] [Posters]
[with selected papers from user groups]   [IZM-Labs only]
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unfortunately no abstract available E. Langer, S. D?britz, A. R?der, W. Hauffe
Studies of polycrystalline materials by Pseudo Kossel technique
Fresenius J. Anal. Chem. 365 (1999), 212-216
 
abstractN. Engler, H. S. Leipner, R. F. Scholz, P. Werner, F. Syrowatka, J. Schreiber, U. G?sele
Investigations of extended defects after sulfur diffusion in GaAs
Sol. State Phen. 69-70 (1999), 443-448
 
abstractF. Heyroth, H.-R. H?che and C. Eisenschmidt
Contrast in X-ray section topographs of perfect silicon crystals using the Laue-Laue three-beam case of diffraction
J. Appl. Cryst. 32 (1999), 489-496
 
abstractF. Heyroth, H.-R. H?che and C. Eisenschmidt
Imaging of the energy flow in the three-beam case of X-ray diffraction
J. Phys. D: Appl. Phys. 32 (1999), A133-138
 
abstractH. S. Leipner, C. H?bner, T. E. M. Staab, M. Haugk, R. Krause-Rehberg
Positron annihilation at dislocations and related point defects in semiconductors
phys. stat. sol. (a) 171 (1999), 377-382
 
abstractJ. Schreiber, L. H?ring, H. Uniewski, S. Hildebrandt, H. S. Leipner
Recognition and distribution of A(g) and B(g) dislocations in indentation zones on {111} and {110} surfaces of CdTe
phys. stat. sol. (a) 171 (1999), 89-97
 
abstractF. Heyroth, C. Eisenschmidt, H.-R. H?che
X-ray topography of perfect crystals using the Laue-Laue three-beam case of diffraction
Cryst. Res. Technol. 33 (1998), 547-554
 
unfortunately no abstract available R. Krause-Rehberg, H. S. Leipner, A. Polity, F. Rudolf, R. Hammer, M. Jurisch
Mechanical damage in GaAs wafers introduced by a diamond saw: A study by means of positron annihilation and electron microscopy
phys. stat. sol. (a) 158,2 (1998), 377-383
 
abstractC. Medrano, F. Heyroth, M. Schlenker, J. Baruchel and J.Espeso
Two- and Three-Beam X-ray Diffraction Imaging of Domains in Magnetite
J. Appl. Cryst. 31 (1998), 726-732
 
abstractS. Hildebrandt, J. Schreiber, W. Hergert, H. Uniewski, H. S. Leipner
Theoretical fundamentals and experimental materials and defect studies using quantitative scanning electron microscopy-cathodoluminescence/electron beam induced current on compound semiconductors
Scanning Microsc. Intern. 12, 4 (1998), 535-552
 
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